i-atomic force afm microscope
I-Atomic Force Microscope (AFM), ithuluzi lokuhlaziya elingasetshenziswa ukutadisha isakhiwo esingaphezulu sezinto eziqinile, okufaka phakathi izivikeli.Icwaninga isakhiwo esingaphezulu nezici zento ngokuthola ukusebenzisana okubuthakathaka kakhulu kwe-interatomic phakathi kwendawo yesampula ezohlolwa kanye nento ezwelayo yamandla amancane.Kuyoba pair of force obuthakathaka ebucayi ngokwedlulele micro-cantilever ekupheleni fixed, omunye umkhawulo ithiphu encane eduze isampula, khona-ke kuyoba uxhumana nalo, amandla uzokwenza deformation micro-cantilever noma izinguquko isimo ukunyakaza.Lapho siskena isampula, inzwa ingasetshenziswa ukuthola lezi zinguquko, singathola ukusatshalaliswa kolwazi lwamandla, ukuze sithole i-morphology engaphezulu yolwazi lwe-nano-resolution kanye nolwazi lokuma okungaphezulu.
★ I-probe yokuskena edidiyelwe kanye nestag yesampula ithuthukise ikhono lokulwa nokuphazamiseka.
★ I-laser enembile kanye nedivayisi yokumisa i-probe yenza ukushintsha uphenyo nokulungisa indawo kube lula futhi kube lula.
★ Ngokusebenzisa isampula ye-probe esondelayo, inaliti yayingaqondana nesampula yokuskena.
★ Automatic pulse motor drive control isampula probe esondela mpo, ukufeza ukuma okunembile kwendawo yokuskena.
★ Isampula kuthwetshulwa indawo nesithakazelo inganyakaziswa ngokukhululekile ngokusebenzisa umklamo ukunemba okusezingeni eliphezulu isampula idivayisi yeselula.
★ Isistimu yokubuka ye-CCD enendawo yokubona ifinyelela ukubonwa kwesikhathi sangempela kanye nokuma kwendawo yokuskena yesampula ye-probe.
★ Ukwakhiwa kwesistimu yokulawula ye-elekthronikhi ye-modularization kusize ukugcinwa nokuthuthukiswa okuqhubekayo kwesekethe.
★ Ukuhlanganiswa kwesekethe yokulawula imodi yokuskena eminingi, sebenzisana nohlelo lwesoftware.
★ Spring ukumiswa okuyinto elula futhi ezingokoqobo ngcono anti-ukugxambukela ikhono.
| Imodi yokusebenza | I-FM-Tapping, ukuthintana ozikhethela, ukungqubuzana, isigaba, kazibuthe noma i-electrostatic |
| Usayizi | Φ≤90mm,H≤20mm |
| Ububanzi beskena | 20 mmmin XYdirection,2 mm ekuqondeni kuka-Z. |
| Isixazululo sokuskena | 0.2nm ekuqondeni kwe-XY,0.05nm ekuqondeni kwe-Z |
| Ukuhamba kobubanzi besampula | ± 6.5mm |
| Ububanzi be-Pulse yezindlela zemoto | 10±2ms |
| Iphoyinti lesampula lesithombe | 256×256,512×512 |
| Ukukhulisa i-Optical | 4X |
| Ukulungiswa kwe-Optical | 2.5 mm |
| Izinga lokuskena | 0.6Hz ~ 4.34Hz |
| Skena i-engeli | 0°~360° |
| Ukulawula ukuskena | I-18-bit D/A ekuqondeni kwe-XY,I-16-bit D/A ekuqondeni kuka-Z |
| Ukusampula kwedatha | I-14-bitA / D,isampula ye-double16-bit A/D eneziteshi eziningi |
| Impendulo | Impendulo yedijithali ye-DSP |
| Izinga lesampula lempendulo | 64.0KHz |
| Isixhumi esibonakalayo sekhompyutha | I-USB2.0 |
| Indawo yokusebenza | Windows98/2000/XP/7/8 |